FADE: Fault-Aware Adaptive On-Die ECC for Improving Robustness
FADE: Fault-Aware Adaptive On-Die ECC for Improving Robustness
Abstract:
The increasing density of dynamic random access memory (DRAM) renders permanent faults and soft errors more prevalent, which critically reduces yield and reliability. Although error correction code (ECC) can mitigate this issue, existing ECCs are not optimized for fault correction. As a result, fault tolerance remains insufficient, and the error correction capability in the presence of faults is degraded. Therefore, to improve DRAM robustness by efficiently addressing both permanent faults and soft errors, this brief proposes a fault-aware adaptive on-die ECC (FADE) in which two ECC engines independently operate in either fault mode (FM) or error mode (EM) according to the number of faulty symbols (FSs). In FM, a fault polynomial is reconstructed by reusing the fault addresses that the built-in self-repair (BISR) stores in content-addressable memory (CAM). To calculate the corresponding fault magnitudes, a modified decoding equation is employed. As a result, the number of correctable FSs in FM doubles compared to the conventional ECC. Moreover, with the proposed symbol-based fault isolation, both fault tolerance and error correction capability in the presence of faults are drastically enhanced. Additionally, the experimental results show that the proposed design can be implemented with a reasonable overhead in terms of delay and area.
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FADE: Fault-Aware Adaptive On-Die ECC for Improving Robustness
